Medium characterization from interface-wave impedance and ellipticity using simultaneous displacement and pressure

K N van Dalen1, G G Drijkoningen, D M J Smeulders

  • 1Faculty of Civil Engineering and Geosciences, Department of Geotechnology, Delft University of Technology, Stevinweg 1, 2628 CN Delft, The Netherlands. k.n.vandalen@tudelft.nl

Summary

Researchers developed a new method using interface wave attributes to accurately estimate material properties. This technique combines pseudo-Rayleigh (pR) and Stoneley (St) wave impedances for stable parameter extraction, validated experimentally.