Single-nanopore investigations with ion conductance microscopy

Chiao-Chen Chen1, Yi Zhou, Lane A Baker

  • 1Department of Chemistry, Indiana University, 800 E. Kirkwood Avenue, Bloomington, Indiana 47405, United States.

ACS Nano
|September 20, 2011
PubMed
Summary

Scanning ion conductance microscopy (SICM) revealed distinct electrical properties of single nanopores. This technique differentiates pore geometry, crucial for understanding ion transport in nanoscale devices.

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