Short-duration transient visual evoked potential for objective measurement of refractive errors

Aashish Anand1, Carlos Gustavo V De Moraes, Christopher C Teng

  • 1Einhorn Clinical Research Center, New York Eye and Ear Infirmary, 310 East 14th Street, New York, NY 10003, USA.

Summary

This study shows that short-duration transient visual evoked potential (SD t-VEP) can objectively measure refractive errors. A VEP scoring system accurately identifies myopia and hypermetropia, aiding in objective refraction.

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