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Mueller matrix differential decomposition for direction reversal: application to samples measured in reflection and
Noé Ortega-Quijano1, José Luis Arce-Diego
1Applied Optical Techniques Group, Electronics Technology, Systems and Automation Engineering Department, University of Cantabria, 39005 Santander, Cantabria, Spain.
Optics Express
|September 22, 2011
Summary
This study extends Mueller matrix differential decomposition for analyzing optical sample polarimetry to backward measurements. The novel method successfully characterizes depolarizing anisotropic media in reflection and backscattering configurations.
Area of Science:
- Optics and Photonics
- Materials Science
Background:
- Mueller matrix differential decomposition is a novel technique for analyzing polarimetric properties.
- The method has previously been limited to transmission measurements.
Purpose of the Study:
- To extend Mueller matrix differential decomposition to backward (reflection and backscattering) configurations.
- To discuss modifications of differential matrices for different reference systems.
Main Methods:
- Eigenanalysis of the Mueller matrix.
- Decomposition of the differential Mueller matrix into 16 differential matrices.
- Application to Mueller matrices measured in reflection and backscattering.
Main Results:
- Successfully adapted the Mueller matrix differential decomposition method for backward measurements.
- Demonstrated the characterization of depolarizing anisotropic media in reflection and backscattering.
- Analyzed modifications of differential matrices relevant to the reference system.
Conclusions:
- The extended Mueller matrix differential decomposition method is effective for analyzing polarimetric properties in backward configurations.
- This advancement broadens the applicability of Mueller matrix differential decomposition in optical sample analysis.
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