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Updated: May 29, 2026

Fabrication of Gate-tunable Graphene Devices for Scanning Tunneling Microscopy Studies with Coulomb Impurities
Published on: July 24, 2015
Satoru Masubuchi1, Miho Arai, Tomoki Machida
1Institute of Industrial Science, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan. msatoru@iis.u-tokyo.ac.jp
We fabricated graphene/graphene oxide/graphene junctions using atomic force microscopy. Local anodic oxidation lithography allowed tuning graphene oxide
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