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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on: August 20, 2019
R R Fahrtdinov1, O V Feklisova, M V Grigoriev
1Institution of Russian Academy of Sciences, Institute of Microelectronics Technology, and High-Purity Materials RAS, Chernogolovka 142432 Russia.
The x-ray beam induced current (XBIC) method effectively images silicon grain boundaries using a laboratory X-ray source and polycapillary optics. This technique shows promise for material analysis and defect characterization.
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