Related Experiment Video

Updated: May 28, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Sub-micrometer charge modulation microscopy of a high mobility polymeric n-channel field-effect transistor

Calogero Sciascia1, Nicola Martino, Torben Schuettfort

  • 1Center for Nano Science and Technology @PoliMi, Istituto Italiano di Tecnologia, Via Pascoli 70/3, 20133 Milano, Italy.

Advanced Materials (Deerfield Beach, Fla.)
|October 13, 2011
PubMed
Summary

No abstract available in PubMed .

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