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A new method for phase identification for electron diffractionists.

A D Mighell1, V L Himes

  • 1Reactor Radiation Division, National Institute of Standards and Technology, Gaithersburg, Maryland 20899.

Journal of Electron Microscopy Technique
|October 1, 1990
PubMed
Summary
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A new analytical procedure accurately identifies solid-state materials using electron microscopy and spectroscopy. This method precisely characterizes crystalline samples from 10 microns down to 10 angstroms.

Area of Science:

  • Materials Science
  • Crystallography
  • Analytical Chemistry

Background:

  • Accurate phase identification is crucial for characterizing solid-state materials.
  • Existing methods may have limitations in sample size and precision.
  • The NIST CRYSTAL DATA database provides extensive crystallographic information.

Purpose of the Study:

  • To develop an accurate analytical procedure for phase identification of solid-state materials.
  • To enable characterization of crystalline samples in the size range of 10 microns to 10 angstroms.
  • To establish a reliable method for identifying unknown materials using electron diffraction and spectroscopy.

Main Methods:

  • Utilizing a modern analytical electron microscope (AEM) for data collection.
  • Obtaining lattice information through sample rotation to collect multiple diffraction planes.

Related Experiment Videos

  • Determining chemical composition using energy-dispersive spectroscopy (EDS).

    • Main Results:

    • A procedure was developed for unique material characterization based on lattice and chemical composition.
    • The method allows for the deduction of a unit cell defining the lattice from experimental data.
    • Identification is achieved by matching experimental data against the NIST CRYSTAL DATA database.

    Conclusions:

    • The developed analytical procedure is highly selective and reliable for phase identification.
    • This method opens new frontiers in the characterization of nanoscale crystalline materials.
    • Combining lattice and elemental data provides a robust approach for material identification.