Optical scan analysis to detect minor misfit on implant-supported superstructures

Area of Science:

• Dental Implantology
• Prosthodontics
• Biomaterials Science

Background:

• Achieving absolute passive fit for implant-supported superstructures remains a challenge despite advancements in fabrication.
• Traditional laboratory techniques for fit analysis exist, but novel methods are needed for consistent evaluation.

Purpose of the Study:

• To evaluate and compare two methods for assessing the passive fit of implant-supported superstructures.
• To determine the efficacy of optical scanning and strain gauge measurements in detecting prosthesis misfit.

Main Methods:

• Two implant-supported superstructures were fabricated: one control (accurate fit) and one test (intentionally misfit).
• Misfit was introduced by manipulating scanned data for the test superstructure.
• Both superstructures were analyzed using optical scanning and strain gauge measurements by a blinded investigator.

Main Results:

• Optical scanning detected discrepancies, with the misfit frame showing a 29 μm misfit at the manipulated connection.
• Strain gauge measurements revealed a higher mean deviation in the misfit model (26.2 μm) compared to the control (15.3 μm).
• Both methods successfully identified the intentionally induced misfit.

Conclusions:

• Optical scan analysis effectively detected misfit in implant-supported superstructures.
• Strain gauge measurements corroborated the findings of optical scanning.
• Optical scanning presents a simplified and clinically applicable approach for detecting minor misfits in implant prosthetics.