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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Atomic Emission Spectroscopy: Interference01:30

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In atomic emission spectroscopy (AES), high-temperature atomizers excite a broad range of elements and molecules that generate complex emissions from sources such as oxides, hydroxides, and flame combustion products in the flame or plasma. Several strategies can be employed to minimize spectral interferences caused by overlapping emission lines or bands. These include increasing instrument resolution, choosing alternative emission lines, optimally placing the detector in low-background regions,...
Atomic Absorption Spectroscopy: Interference01:25

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Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
Phase Contrast and Differential Interference Contrast Microscopy01:26

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Related Experiment Video

Updated: May 26, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

Moiré pattern from a multiple Bragg-Laue interferometer.

Kenji Hirano1, Tomoe Fukamachi, Yoshinobu Kanematsu

  • 1Saitama Institute of Technology, Fukaya, Saitama, Japan. hirano_k@sit.jp

Journal of Synchrotron Radiation
|December 22, 2011
PubMed
Summary

A moiré pattern in X-ray section topography reveals the coherency of X-rays. This technique uses interference fringes from a split beam to analyze X-ray properties from bending-magnet beamlines.

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Area of Science:

  • Materials Science
  • Crystallography
  • Optics

Background:

  • X-ray section topography is a powerful technique for analyzing crystal structures.
  • Understanding the coherency of X-rays is crucial for advanced diffraction experiments.

Purpose of the Study:

  • To observe and explain the moiré pattern in X-ray section topography.
  • To utilize the moiré pattern for estimating X-ray coherency.

Main Methods:

  • Utilizing X-ray section topography in a multiple Bragg-Laue diffraction mode.
  • Splitting the incident X-ray beam using a platinum wire.
  • Analyzing the resulting moiré pattern formed by interfering beams.

Main Results:

  • A distinct moiré pattern was observed in silicon (Si) 220 diffraction.
  • The moiré pattern was successfully explained as the summation of two interference fringes.
  • The coherency of X-rays from a bending-magnet beamline was estimated.

Conclusions:

  • Moiré patterns in X-ray topography provide a method for assessing X-ray beam coherency.
  • This technique offers a practical approach to characterizing X-ray sources for diffraction studies.