A forward bias method for lag correction of an a-Si flat panel detector

Jared Starman1, Carlo Tognina, Larry Partain

  • 1Department of Electrical Engineering, Stanford University, Stanford, California 94305, USA. jared.starman@gmail.com

Medical Physics
|January 10, 2012
PubMed
Summary

A new hardware method significantly reduces detector lag in amorphous silicon flat panel x-ray detectors. This technique minimizes ghosting in images and shading artifacts in cone-beam computed tomography (CBCT) reconstructions.

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