X-ray diffraction imaging with the Multiple Inverse Fan Beam topology: principles, performance and potential for...

Area of Science:

• Security screening technology
• Materials analysis
• Explosives detection

Background:

• Increasing threat classes (HMEs, LAGs) raise false alarm rates in security equipment.
• X-ray diffraction (XRD) provides multiple features for solid and LAGs explosive detection.
• X-ray diffraction imaging (XDI) combines image formation and material analysis.

Purpose of the Study:

• To introduce and describe the Multiple Inverse Fan Beam (MIFB) XDI topology.
• To present physical relationships and experimental performance of MIFB XDI components.
• To assess MIFB XDI performance against existing security screeners and outline its potential.

Main Methods:

• Description of the Multiple Inverse Fan Beam (MIFB) XDI topology.
• Presentation of physical relationships for radiation source, collimators, and detectors.
• Measurement and display of X-ray diffraction profiles for threat substances using a laboratory MIFB XDI system.

Main Results:

• Experimental performance data for MIFB XDI components were achieved.
• Representative X-ray diffraction profiles of threat substances were obtained.
• MIFB XDI performance was assessed relative to the 2nd Generation XRD 3500TM screener.

Conclusions:

• MIFB XDI offers enhanced features for classifying explosive threats, reducing false alarms.
• The technology shows potential for reducing costs in hold baggage screening.
• MIFB XDI can enable simultaneous "in situ" detection of liquid and solid explosives in carry-on baggage.