Electrical impedance tomography reconstruction through Simulated Annealing with incomplete evaluation of the

Thiago de Castro Martins1, Erick Dario León Bueno de Camargo, Raul Gonzalez Lima

  • 1Computational Geometry Laboratory, Escola Politécnica, São Paulo University, Brazil. thiago@usp.br

Summary

This study introduces a faster Electrical Impedance Tomography (EIT) reconstruction method by partially evaluating the objective function during Simulated Annealing (SA). This optimization significantly reduces computational cost while maintaining accuracy for EIT imaging.