Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Selenium Attenuates LPS-Induced Injury in Ovine Granulosa Cells by Protecting Mitochondrial Ultrastructure and Cellular Homeostasis.

Animals : an open access journal from MDPI·2026
Same author

Effects of Simulated Body-Mass Reduction on Peak Knee Joint Loads During Daily Functional Activities.

Annals of biomedical engineering·2026
Same author

Prediction of Early Hospital Admission (≤24 Hours) After Stroke Using Machine Learning and Deep Learning: Multicenter Study From China.

JMIR medical informatics·2026
Same author

Towards a physics-informed network paradigm with data generation and background noise removal for different distributed acoustic sensing applications.

Light, science & applications·2026
Same author

Sedentary behavior type matters: compositional analysis of 24-hour movement behaviors and cognitive function in older adults.

Journal of activity, sedentary and sleep behaviors·2026
Same author

3D-nanoprinted vertical coupler using hybrid lithography for optical redistribution applications.

Optics letters·2026

Related Experiment Video

Updated: May 25, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
09:10

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements

Published on: December 5, 2025

High-reflectivity-resolution coherent optical frequency domain reflectometry using optical frequency comb source and

Zuyuan He1, Takushi Kazama, Yusuke Koshikiya

  • 1Department of Electrical Engineering and Information Systems, The University of Tokyo 7-3-1 Hongo, Tokyo 113-8656, Japan. zhe@ieee.org

Optics Express
|January 26, 2012
PubMed
Summary

We introduce a new method, delay shift averaging (DSAV), for high-reflectivity-resolution optical frequency domain reflectometry (OFDR). This technique suppresses noise, offering an effective alternative to previous methods without expensive filters.

More Related Videos

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator
07:42

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator

Published on: December 15, 2021

Related Experiment Videos

Last Updated: May 25, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
09:10

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements

Published on: December 5, 2025

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator
07:42

Rapid Repetition Rate Fluctuation Measurement of Soliton Crystals in a Microresonator

Published on: December 15, 2021

Area of Science:

  • Photonics
  • Optical Metrology
  • Signal Processing

Background:

  • Coherent optical frequency domain reflectometry (OFDR) is crucial for high-resolution measurements.
  • Fading noise limits the reflectivity resolution in conventional OFDR systems.
  • Previous methods like frequency shift averaging (FSAV) require expensive optical filters.

Purpose of the Study:

  • To propose and validate a novel delay shift averaging (DSAV) scheme for OFDR.
  • To achieve high reflectivity resolution while suppressing fading noise.
  • To offer a cost-effective alternative to existing high-resolution OFDR techniques.

Main Methods:

  • Utilized an optical frequency comb source and a tunable delay line.
  • Implemented the novel delay shift averaging (DSAV) technique.
  • Combined DSAV with frequency shift averaging (FSAV) for enhanced performance.

Main Results:

  • The DSAV scheme theoretically and experimentally demonstrated high reflectivity resolution.
  • DSAV achieves comparable reflectivity resolution to FSAV without requiring narrow-pass-band filters.
  • Combining DSAV with FSAV yielded superior reflectivity resolution compared to FSAV alone with a single-wavelength laser.

Conclusions:

  • The proposed DSAV scheme effectively suppresses fading noise in OFDR.
  • DSAV provides a more economical approach to achieving high reflectivity resolution in OFDR.
  • The synergistic combination of DSAV and FSAV offers advanced performance for optical reflectometry.