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Estimation of multiple phases from a single fringe pattern in digital holographic interferometry
Gannavarpu Rajshekhar1, Sai Siva Gorthi, Pramod Rastogi
1Applied Computing and Mechanics Laboratory, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland.
Optics Express
|January 26, 2012
Summary
This study presents a new digital holographic interferometry method for measuring multidimensional displacements. It efficiently estimates multiple interference phases from a single fringe pattern without spatial carrier filtering.
Area of Science:
- Optics and Photonics
- Metrology
- Deformation Measurement
Background:
- Digital holographic interferometry (DHI) is crucial for measuring multidimensional displacements.
- Accurate estimation of multiple interference phase distributions from DHI is challenging.
- Existing methods often require complex spatial carrier filtering.
Purpose of the Study:
- To introduce an efficient method for simultaneous estimation of multiple interference phases from a single fringe pattern in DHI.
- To overcome limitations of traditional phase retrieval techniques in multidimensional displacement measurements.
- To enable direct retrieval of multiple phases without spatial carrier filtering.
Main Methods:
- Modeling the reconstructed interference field as a piecewise multicomponent polynomial phase signal.
- Estimating polynomial coefficients using the product high-order ambiguity function.
- Employing an amplitude-based discrimination criterion for component matching.
Main Results:
- Successful simultaneous estimation of multiple phases from a single fringe pattern.
- Demonstration of direct phase retrieval without spatial carrier filtering.
- Accurate measurement of multidimensional displacements enabled by the novel method.
Conclusions:
- The proposed method offers an elegant and efficient solution for phase retrieval in DHI.
- It simplifies the process of measuring multidimensional displacements.
- This technique enhances the applicability of digital holographic interferometry in various scientific and engineering fields.
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