Material limitations on the detection limit in refractometry

Peder Skafte-Pedersen1, Pedro S Nunes, Sanshui Xiao

  • 1Department of Micro and Nanotechnology, Technical University of Denmark, DTU Nanotech, Building 345 East, DK-2800 Kongens Lyngby, Denmark; E-Mails: peder.skafte-pedersen@nanotech.dtu.dk (P.S.P.); pedro.nunes@nanotech.dtu.dk (P.S.N.).

Summary

This study explores the detection limits of refractometric sensors using high-quality (high-Q) optical cavities. We show that the ultimate classical detection limit is related to the material

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