Phase Contrast and Differential Interference Contrast Microscopy
X-ray Imaging
Electron Microscope Tomography and Single-particle Reconstruction
Super-resolution Fluorescence Microscopy
X-ray Diffraction of Biological Samples
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Changqing Xie1, Xiaoli Zhu, Hailiang Li
1Key Laboratory of Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China. xiechangqing@ime.ac.cn
Modified photon sieves (MPSs) offer advanced two-dimensional (2D) hard X-ray differential-interference-contrast (DIC) imaging. These novel optics provide superior resolution and contrast for nondestructive imaging of microelectronic circuits.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: