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Rizwan Ahmed1, Michael Sams, Clemens Simbrunner

  • 1Institute of Semiconductor & Solid State Physics, Johannes Kepler Universität, Linz, Austria.

Synthetic Metals
|February 28, 2012
PubMed
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This study assessed organic n-type field effect transistors (OFETs) using C60. While showing good short-term reproducibility and stability, long-term measurements revealed a decay in device parameters.

Area of Science:

  • Materials Science
  • Organic Electronics
  • Semiconductor Devices

Background:

  • Organic field-effect transistors (OFETs) are crucial for flexible electronics.
  • Reproducibility and stability are key challenges for commercializing OFETs.
  • Fullerenes like C60 are promising n-type semiconductor materials for OFETs.

Purpose of the Study:

  • To evaluate the fabrication reproducibility of C60-based n-type OFETs.
  • To assess the long-term operational stability of these devices.
  • To identify parameter fluctuations over extended measurement periods.

Main Methods:

  • Fabrication of 48 C60-based OFET devices.
  • 24-hour continuous measurements under inert conditions (glove box).
  • Long-term stability testing up to three months.

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Main Results:

  • C60-based OFETs demonstrated good reproducibility in fabrication.
  • Short-term measurements (24h) indicated high device stability.
  • Long-term measurements revealed a decay in key device parameters over three months.

Conclusions:

  • C60 is a viable material for reproducible n-type OFET fabrication.
  • While stable for short durations, long-term operational stability requires further investigation.
  • Understanding parameter decay is essential for developing reliable organic electronic devices.