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Updated: May 24, 2026

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
Published on: April 29, 2020
Characterization of ion profiles in light-emitting electrochemical cells by secondary ion mass spectrometry
Samuel B Toshner1, Zihua Zhu, Ilya V Kosilkin
1Department of Physics and Astronomy, Western Washington University, Bellingham, Washington 98225-9164, USA.
Abstract:
Ion profiles in polymer light-emitting electrochemical cells are known to significantly affect performance and stability, but are not easily measured. Here, secondary ion mass spectrometry is used to investigate ion profiles in both dynamic and chemically fixed junction devices. Results indicate lower reversibility of dynamic junctions and a more significant time delay for ion redistribution than previously expected, but confirm the complete immobilization of ions in chemically fixed junction devices. When compared with prior studies analyzing the electric field profiles in similar devices, these results help to elucidate the roles of ion distribution and electrochemical doping in LECs.
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