Recent progress in the application of atomic force microscopy for supported lipid bilayers

Jian Zhong1, Dannong He

  • 1National Engineering Research Center for Nanotechnology, Shanghai 200241, PR China. jianzhongpku@hotmail.com

Summary

Atomic force microscopy (AFM) advances membrane studies. Recent progress in AFM for supported lipid bilayers includes high-resolution imaging, in situ observation, and nanomechanics measurements.