Theory of Metallic Conduction
Electrical Conductivity
Boundary Conditions for Current Density
Carrier Transport
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
P Di Sia1, V Dallacasa, F Dallacasa
1Laboratory of Materials Analysis, Scientific and Technological Department, University of Verona, Strada Le Grazie, 1-37134, Verona, Italy.
Electron transfer in nanostructures is challenging. Theoretical studies reveal carrier diffusion coefficients can approach single-crystal values in nanostructured titanium dioxide (TiO2) and zinc oxide (ZnO) films, even with disorder.
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