Current mode atomic force microscopy (C-AFM) study for local electrical characterization of conjugated polymer blends

Li-Ting Lee1, Shinzaburo Ito, Hiroaki Benten

  • 1Department of Material Science and Engineering, Feng Chia University, Taiwan. ltlee@fcu.edu.tw

Ambio
|March 22, 2012
PubMed
Summary

This study investigated polymer blends of regioregular poly(3-hexylthiophene) (P3HT) and poly(NDI2OD-T2) for polymer solar cells. Current mode atomic force microscopy revealed phase-separated domains and local electrical characteristics within these blends.