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Published on: January 28, 2019
Phase recovering without phase unwrapping in phase-shifting interferometry by cubic and average interpolation
Alejandro Téllez-Quiñones1, Daniel Malacara-Doblado
1Centro de Investigaciones en Óptica, A. C., Loma del Bosque 115, Col. Lomas del Campestre, C. P. 37150, León, Guanajuato, Mexico. alejandroteq@cio.mx
This study introduces a simple phase estimation method using interpolation to address oversampling issues in modulated phase images. It enables accurate wavefront recovery even with high fringe densities and complex aberrations.
Area of Science:
- Optical metrology
- Wavefront sensing
- Image processing
Background:
- Phase reconstruction from modulated phase images is crucial for wavefront analysis.
- Oversampling is often required to accurately reconstruct phases, especially with high fringe densities and aberrations.
- Existing methods may face challenges with complex phase profiles and computational efficiency.
Purpose of the Study:
- To present a simple phase estimation technique to solve the oversampling problem in smooth modulated phase images.
- To enable wavefront shape recovery from modulated phase images with high fringe density without phase unwrapping.
- To propose an oversampling procedure based on a quadratic cost functional for phase recovery.
Main Methods:
- Employs cubic and average interpolations for phase estimation.
- Utilizes modulated phase images within a general phase-shifting process.
- Applies an oversampling procedure derived from analyzing a quadratic cost functional.
Main Results:
- Successfully recovers wavefront shapes with high fringe density.
- Addresses the oversampling problem inherent in phase reconstruction from modulated images.
- Demonstrates a method suitable for phases with higher-order aberration values.
Conclusions:
- The proposed simple phase estimation method effectively solves the oversampling problem.
- This technique allows for accurate wavefront recovery from modulated phase images, even with complex aberrations.
- The approach offers a practical solution for phase reconstruction in optical metrology applications.
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