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Opaque optics thickness measurement using a cyclic path optical configuration setup and polarization phase shifting
Y Pavan Kumar1, Sanjib Chatterjee
1Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India. ypk@rrcat.gov.in
Applied Optics
|March 24, 2012
Summary
This study presents a novel method for measuring opaque optics thickness using a cyclic path optical configuration (CPOC) and polarization phase shifting interferometry (PPSI). The technique accurately determines thickness by measuring a beam
Area of Science:
- Optics and Photonics
- Metrology
- Materials Science
Background:
- Accurate thickness measurement of opaque materials is crucial in various scientific and industrial applications.
- Traditional methods may face limitations with opaque samples or require complex setups.
Purpose of the Study:
- To develop and demonstrate a non-contact optical method for precise thickness determination of opaque optics.
- To utilize a cyclic path optical configuration (CPOC) combined with polarization phase shifting interferometry (PPSI).
Main Methods:
- A CPOC setup was employed to simultaneously focus two orthogonally polarized, counterpropagating beams.
- Opaque optics were placed in the hypotenuse arm, causing a longitudinal shift in one beam's focus due to its thickness.
- PPSI was applied to measure this longitudinal shift, which is twice the optic's thickness.
Main Results:
- The thickness of a 0.660 mm silicon plate was measured with a high degree of accuracy.
- The measurement uncertainty was determined to be 0.013 mm, demonstrating the method's precision.
Conclusions:
- The presented CPOC and PPSI method offers a reliable and accurate approach for opaque optics thickness measurement.
- This technique has potential applications in quality control and material characterization where precise thickness is critical.
