A convenient method for electron tomography sample preparation using a focused ion beam

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Updated: May 23, 2026

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

Published on: October 25, 2021

Xiongyao Wang1, Ross Lockwood, Doug Vick

  • 1National Institute for Nanotechnology, Edmonton, 11421 Saskatchewan Drive, Canada.

Microscopy Research and Technique
|March 31, 2012
PubMed

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