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Fast scanning mode and its realization in a scanning acoustic microscope
Bing-Feng Ju1, Xiaolong Bai, Jian Chen
1The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027, People's Republic of China. mbfju@zju.edu.cn
The Review of Scientific Instruments
|April 3, 2012
Summary
This study introduces two novel, fast scanning modes for mechanical scanning systems, reducing total scanning time by 29%. These adaptable modes enhance efficiency without compromising stability, benefiting systems like scanning acoustic microscopes.
Area of Science:
- Mechanical Engineering
- Instrumentation
- Materials Science
Background:
- Scanning speed is a critical factor limiting the efficiency of mechanical scanning measurement systems.
- Conventional raster and spiral scan modes are widely used but can be time-consuming.
- Optimizing scanning strategies is essential for improving measurement throughput.
Purpose of the Study:
- To analyze the scanning time of conventional raster and spiral scan modes.
- To propose and evaluate two novel, faster scanning modes for two-dimensional mechanical scanning systems.
- To demonstrate the applicability and benefits of these new modes in a Scanning Acoustic Microscope (SAM).
Main Methods:
- Detailed scanning time analysis of conventional raster and spiral scan modes.
- Development and implementation of two new fast scanning modes (fast raster and square spiral).
- Experimental comparison of image acquisition times using conventional and proposed fast scan modes on a self-developed SAM.
Main Results:
- The two proposed fast scan modes achieved a 29% reduction in total scanning time compared to conventional modes.
- The fast scan modes offer high-speed scanning without sacrificing system stability.
- No additional configuration difficulties were introduced by the new scanning modes.
Conclusions:
- The proposed fast scanning modes provide an effective solution for increasing the efficiency of mechanical scanning measurement systems.
- These modes are universally adaptable and can be easily implemented in systems with various driving actuators.
- The universal adaptability makes them suitable for diverse applications, including atomic force microscopy and scanning tunneling microscopy.
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