Surface plasmon microscopy: resolution, sensitivity and crosstalk

This paper develops the theoretical framework to understand the capability of the interferometric surface plasmon microscope to quantify sample properties in a confined region. We use rigorous diffraction theory to quantify the ability of the system to measure local properties and eliminate crosstalk from adjacent regions. We argue that the interferometric system in the defocused condition defines the measured point of excitation and reradiation of the surface plasmons; which greatly improves localisation. We also present results for the noninterferometric microscope, which confirm that the interferometric based system can perform quantitative measurements over smaller regions.