Related Experiment Video
Updated: May 23, 2026

11:33
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
A robust scanning diamond sensor for nanoscale imaging with single nitrogen-vacancy centres
P Maletinsky1, S Hong, M S Grinolds
1Department of Physics, Harvard University, Cambridge, Massachusetts 02138, USA.
Nature Nanotechnology
|April 17, 2012
Summary
This study presents a new method for scanning single nitrogen-vacancy (NV) centers in diamond using a diamond nanopillar tip. This technique enhances NV center performance for nanoscale sensing applications.
Area of Science:
- Quantum sensing
- Materials science
- Nanotechnology
Background:
- Nitrogen-vacancy (NV) centers in diamond are promising for nanoscale sensing and quantum technologies.
- Existing scanning methods using diamond nanocrystals have limitations in spin coherence and fluorescence collection.
- Precise positioning of NV centers near samples is crucial for advanced applications.
Purpose of the Study:
- To develop a robust scanning method for single NV centers.
- To overcome limitations of existing scanning probe techniques for NV center applications.
- To improve spin coherence times and fluorescence collection efficiency.
Main Methods:
- Utilizing a high-purity diamond nanopillar with a single NV center as an atomic force microscope tip.
- Positioning the NV center within tens of nanometers of a sample surface.
- Employing waveguiding for enhanced fluorescence collection.
Main Results:
- Achieved long NV spin coherence times of approximately 75 µs.
- Demonstrated enhanced fluorescence collection efficiencies.
- Successfully imaged magnetic domains with 25 nm widths.
- Attained a magnetic field sensitivity of 56 nT/√Hz at 33 kHz.
Conclusions:
- The diamond nanopillar method provides a robust platform for scanning NV centers.
- This approach significantly improves NV center performance for nanoscale sensing.
- The demonstrated sensitivity and imaging capabilities are unprecedented for scanning NV centers.
Related Concept Videos
Atomic Force Microscopy
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Scanning Electron Microscopy
A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Fundamental Principles
Accelerated...
Electron Microscope Tomography and Single-particle Reconstruction
Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

