Snapshot imaging Mueller matrix polarimeter using polarization gratings
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Updated: May 23, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
Michael W Kudenov1, Michael J Escuti, Nathan Hagen
1College of Optical Science, The University of Arizona, 1630 E. University Boulevard, Tucson, Arizona 85721, USA. mkudenov@optics.arizona.edu
Abstract:
A snapshot imaging Mueller matrix polarimeter (SIMMP) is theoretically described and empirically demonstrated through simulation. Spatial polarization fringes are localized onto a sample by incorporating polarization gratings (PGs) into a polarization generator module. These fringes modulate the Mueller matrix (MM) components of the sample, which are subsequently isolated with PGs in an analyzer module. The MM components are amplitude modulated onto spatial carrier frequencies which, due to the PGs, maintain high visibility in spectrally broadband illumination. An interference model of the SIMMP is provided, followed by methods of reconstruction and calibration. Lastly, a numerical simulation is used to demonstrate the system's performance in the presence of noise.
