X-ray Crystallography
Determination of Crystal Structures
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Updated: May 23, 2026

Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
Published on: August 22, 2015
K R Beyerlein1, M Leoni, P Scardi
1Materials Science and Engineering Department, Georgia Institute of Technology, Atlanta, GA, USA. kbeyerlein3@gatech.edu
Accurate modeling of temperature diffuse scattering (TDS) is crucial for interpreting X-ray powder diffraction data, especially for small crystallites. Misrepresenting TDS can cause significant errors in the Debye-Waller parameter and peak broadening analysis.
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