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Updated: May 23, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
The SAMBA quick-EXAFS monochromator: XAS with edge jumping
1Synchrotron SOLEIL, L'Orme des Merisiers, BP 48, Saint Aubin, 91192 Gif sur Yvette, France. fonda@synchrotron-soleil.fr
Abstract:
Results and performances of the QEXAFS double monochromator of the SAMBA beamline (Synchrotron SOLEIL) are presented. The device is capable of speeds of up to 40 Hz, while giving the user the possibility to choose the amplitude of the scan from 0.1° to 4° in a few seconds. The device is composed of two independent units and it is possible to perform scans alternating between two different crystals, literally jumping from low (4 keV) to high (37 keV) energies.
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