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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Transmission Electron Microscopy01:15

Transmission Electron Microscopy

In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400 keV in...
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Optical microscopy uses optic principles to provide detailed images of samples. Antonie van Leeuwenhoek designed the first compound optical microscope in the 17th century to visualize blood cells, bacteria, and yeast cells. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes with enhanced magnification and resolution.
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Overview of Microscopy Techniques01:22

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Super-resolution Fluorescence Microscopy01:37

Super-resolution Fluorescence Microscopy

Super-resolution fluorescence microscopy (SRFM) provides a better resolution than conventional fluorescence microscopy by reducing the point spread function (PSF). PSF is the light intensity distribution from a point that causes it to appear blurred. Due to PSF, each fluorescing point appears bigger than its actual size, and it is the PSF interference of nearby fluorophores that causes the blurred image. Various approaches to achieving higher resolution through SRFM have recently been developed.
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Routine Collection of High-Resolution cryo-EM Datasets Using 200 KV Transmission Electron Microscope
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Image resolution and sensitivity in an environmental transmission electron microscope.

J R Jinschek1, S Helveg

  • 1FEI Company, Achtseweg Noord 5, 5651 GG Eindhoven, The Netherlands.

Micron (Oxford, England : 1993)
|May 8, 2012
PubMed
Summary

Environmental transmission electron microscopy enables atomic-scale imaging of nanomaterials in reactive gases. Optimal conditions maintain 0.10nm resolution, crucial for in situ studies of materials science.

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Area of Science:

  • Materials Science
  • Nanoscience
  • Analytical Chemistry

Background:

  • Environmental transmission electron microscopy (ETEM) allows atomic-scale observation of nanomaterials.
  • In situ studies in reactive gas environments are crucial for understanding material behavior.
  • Achieving high-resolution transmission electron microscopy (HRTEM) in such environments presents challenges.

Purpose of the Study:

  • To determine the optimal conditions for achieving 0.10nm resolution in HRTEM mode within an ETEM.
  • To map the resolution threshold under various gas types, pressures, and electron optical settings.
  • To understand electron-gas interactions that degrade image resolution.

Main Methods:

  • Utilized an environmental transmission electron microscope (ETEM) in high-resolution transmission electron microscopy (HRTEM) mode.
  • Systematically varied gas types (H2, N2), pressures (1-10mbar), electron beam energies, doses, and dose-rates.
  • Employed complementary techniques: electron diffraction (ED), scanning transmission electron microscopy (STEM), and electron energy loss spectroscopy (EELS).

Main Results:

  • The 0.10nm resolution threshold was maintained for H2 at 1-10mbar and for N2 up to at least 10mbar.
  • Optimal imaging depended on electron beam energy, dose-rate, and achieving a signal-to-noise (S/N) ratio ≥ 5 (Rose's criterion).
  • Electron-gas interactions were identified as the cause of resolution deterioration.

Conclusions:

  • High-resolution imaging of nanomaterials in reactive gases is feasible under specific ETEM conditions.
  • Careful control of electron beam parameters and gas environment is essential for maintaining atomic-scale resolution.
  • Complementary analytical techniques are vital for a comprehensive understanding of in situ observations.