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Related Experiment Video

Updated: May 21, 2026

Evaluating Targeting Accuracy in the Focal Plane for an Ultrasound-guided High-intensity Focused Ultrasound Phased-array System

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Tuning the detection sensitivity: a model for axial backfocal plane interferometric tracking.

Lars Friedrich¹, Alexander Rohrbach

¹Laboratory for Bio- and Nano-Photonics, Institute for Microsystem Technology (IMTEK), University of Freiburg, Freiburg, Germany.

|June 5, 2012

Summary

Backfocal plane interferometry tracks microscopic particles in 3D. A new Fourier optics model explains how interference patterns correlate with particle position along the optical axis, improving tracking accuracy.

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Last Updated: May 21, 2026

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Published on: April 4, 2017

Area of Science:

Optical physics
Nanotechnology
Biophysics

Background:

Single particle tracking is crucial for observing dynamic processes at the nanoscale.
Backfocal plane (BFP) interferometry offers 3D tracking capabilities but requires precise modeling of optical phenomena.

Purpose of the Study:

To develop a Fourier optics model for Backfocal plane interferometry.
To elucidate the relationship between interference intensity and axial particle displacement.
To optimize particle tracking in BFP interferometry.

Main Methods:

Developed a theoretical Fourier optics model for BFP interferometry.
Derived and experimentally validated the detection numerical aperture.
Analyzed the correlation between interference intensity and axial particle position.

Main Results:

The model accurately describes interference effects for axial particle tracking.
A specific detection numerical aperture range shows positive correlation between intensity and axial position.
Larger detection angles result in a negative correlation.

Conclusions:

The Fourier optics model provides a fundamental understanding of BFP interferometry.
The findings enable optimization of BFP interferometric tracking systems.
This work enhances the precision of 3D single particle displacement measurements.