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Updated: May 21, 2026
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Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
Time-resolved near-edge x-ray absorption fine structure spectroscopy on photo-induced phase transitions using a
P Grossmann1, I Rajkovic, R Moré
1Laser-Laboratorium Göttingen e.V., Hans-Adolf-Krebs-Weg 1, D-37077 Göttingen, Germany. peter.grossmann@llg-ev.de
The Review of Scientific Instruments
|June 7, 2012
Summary
A new table-top soft-X-ray spectrometer enables advanced experiments, previously requiring large synchrotron facilities. This breakthrough allows detailed studies of material phase transitions with high temporal resolution.
Area of Science:
- Atomic and Molecular Physics
- Materials Science
- Spectroscopy
Background:
- Synchrotron radiation sources are traditionally required for advanced soft X-ray spectroscopy.
- Table-top X-ray sources offer potential for more accessible experimental setups.
- Investigating optically induced phase transitions requires high temporal and spectral resolution.
Purpose of the Study:
- To develop and demonstrate a table-top soft-X-ray spectrometer for pump-probe experiments.
- To achieve high temporal resolution (approx. 230 ps) in the soft X-ray range (1-5 nm).
- To investigate light-induced phase transitions in materials using near-edge X-ray absorption fine structure (NEXAFS).
Main Methods:
- Utilized a stable laser-driven X-ray source with a gas-puff target.
- Implemented a soft-X-ray spectrometer covering the 1-5 nm wavelength range.
- Performed optical light-pump/soft-X-ray probe NEXAFS experiments.
Main Results:
- Demonstrated the feasibility of table-top soft-X-ray NEXAFS experiments with ~230 ps temporal resolution.
- Successfully measured diminutive changes at the oxygen K edge of Pr(0.7)Ca(0.3)MnO(3) during an optically induced phase transition.
- Conducted measurements in the "water-window" region (2.28-4.36 nm).
Conclusions:
- The developed table-top soft-X-ray spectrometer is practical for demanding investigations.
- This technology democratizes access to experiments previously limited to synchrotron facilities.
- The system enables detailed studies of ultrafast dynamics in materials.
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