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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
Geometrical factor correction in grazing incident x-ray fluorescence experiment
Wenbin Li1, Jingtao Zhu, Xiaoying Ma
1Key Laboratory of Advanced Micro-Structured Materials, MOE, Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China.
The Review of Scientific Instruments
|June 7, 2012
Summary
The geometrical factor significantly impacts grazing incident x-ray fluorescence analysis data. This study presents a formula to estimate this factor, improving fluorescence yield calculations and experimental accuracy.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physics
Background:
- Grazing incident x-ray fluorescence (GIXRF) analysis is a surface-sensitive technique.
- The geometrical factor in GIXRF is crucial as it is angle-dependent and affects measured intensities.
- Accurate quantification in GIXRF requires precise consideration of geometrical effects.
Purpose of the Study:
- To demonstrate the impact of the geometrical factor on fluorescence yield in GIXRF.
- To develop and validate a formula for estimating the geometrical factor in GIXRF experiments.
- To improve the accuracy of quantitative analysis in GIXRF.
Main Methods:
- Theoretical analysis of the geometrical factor in GIXRF.
- Development of a formula incorporating experimental parameters (beam and setup).
- Experimental validation of the proposed formula using GIXRF.
Main Results:
- The geometrical factor significantly influences fluorescence yield measurements.
- A novel formula was derived to estimate the geometrical factor.
- Calculated fluorescence yields using the formula showed excellent agreement with experimental data.
Conclusions:
- The developed formula accurately estimates the geometrical factor in GIXRF.
- This work enhances the reliability and accuracy of quantitative GIXRF analysis.
- The findings are vital for precise material characterization using GIXRF.
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