A full Stokes vector ellipsometry measurement system for in situ diagnostics in dynamic experiments.

L Bakshi1, S Eliezer, G Appelbaum

  • 1Mechanical Engineering Department, Ben Gurion University, Beer Sheva 84105, Israel. bakshi@soreq.gov.il

Summary

A novel nanosecond-resolution ellipsometry system measures dynamic optical properties. It captured emissivity changes in nickel during heating and steel under shock compression, revealing phase transition effects.