Related Experiment Video
Updated: May 21, 2026
Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass
Y Pavan Kumar1, Sanjib Chatterjee
1Department of Atomic Energy, Raja Ramanna Centre for Advanced Technology, Government of India, Indore 452013, India. ypk@rrcat.gov.in
Abstract:
We present a simple technique for simultaneous determination of refractive index and thickness of moderately thick plane-parallel transparent glass plates (GPs) using a cyclic path optical configuration (CPOC) setup and a wedge shear plate as lateral shearing interferometer. The CPOC setup is used to simultaneously focus the counterpropagating converging beams at a common point at its hypotenuse arm. The apparent thickness and real thickness of the test GP are determined by observing three retrocollimation positions of the GP surfaces with respect to the common focus point. The RI is obtained by dividing the real thickness with apparent thickness of the GP. Presented in this paper are the results obtained for a test GP with a thickness of 14.983 mm and a RI of 1.515.
