Atomic Emission Spectroscopy: Overview
Atomic Emission Spectroscopy: Instrumentation
Atomic Emission Spectroscopy: Lab
Atomic Spectroscopy: Absorption, Emission, and Fluorescence
Atomic Absorption Spectroscopy: Atomization Methods
Atomic Absorption Spectroscopy: Instrumentation
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Paul Cueva1, Robert Hovden, Julia A Mundy
1School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.
Improving background estimation in electron energy loss spectroscopy (EELS) mapping enhances chemical sensitivity. New methods reduce errors in low-count, high-resolution EELS data for better analysis.
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