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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Spectroscopy: Absorption, Emission, and Fluorescence01:23

Atomic Spectroscopy: Absorption, Emission, and Fluorescence

Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
Atomic Absorption Spectroscopy: Atomization Methods01:25

Atomic Absorption Spectroscopy: Atomization Methods

Atomic Absorption Spectroscopy (AAS) atomizes samples through flame atomization or electrothermal atomization. Flame atomization typically involves a nebulizer and spray chamber assembly to combine the sample with a fuel–oxidant mixture, creating a fine aerosol mist that enters a burner. Typically, the fuel and oxidant are combined in an approximately stoichiometric ratio. However, for atoms that are easily oxidized, a fuel-rich mixture may be more advantageous. Only about 5% of the aerosol...
Atomic Absorption Spectroscopy: Instrumentation01:22

Atomic Absorption Spectroscopy: Instrumentation

An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
The atomizer used in AAS can be either a flame atomizer or an...

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Updated: May 21, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Data processing for atomic resolution electron energy loss spectroscopy.

Paul Cueva1, Robert Hovden, Julia A Mundy

  • 1School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853, USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|June 16, 2012
PubMed
Summary
This summary is machine-generated.

Improving background estimation in electron energy loss spectroscopy (EELS) mapping enhances chemical sensitivity. New methods reduce errors in low-count, high-resolution EELS data for better analysis.

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Area of Science:

  • Materials Science
  • Spectroscopy
  • Electron Microscopy

Background:

  • Aberration-corrected scanning transmission electron microscopes achieve atomic resolution EELS mapping.
  • Dose-limited and oversampled spectral maps result in low counts/channel, increasing sensitivity to background estimation errors.

Purpose of the Study:

  • To improve background estimation in atomic resolution EELS mapping.
  • To enhance chemical sensitivity and signal extraction from noisy spectral maps.
  • To identify and mitigate artifacts in Principal Component Analysis (PCA) of EELS data.

Main Methods:

  • Utilizing dataset redundancy for improved background estimation.
  • Implementing linear combination of power laws and local background averaging.
  • Analyzing spectrum images using Principal Component Analysis (PCA) and identifying artifacts.

Main Results:

  • Developed and validated methods for reducing background error in EELS data.
  • Demonstrated increased chemical sensitivity through improved background estimation.
  • Identified common artifacts associated with PCA filtering of raw EELS data.

Conclusions:

  • Advanced background estimation techniques significantly improve EELS data analysis.
  • Careful application of PCA or alternative methods is crucial for accurate EELS spectrum imaging.
  • The Cornell Spectrum Imager software package offers open-source tools for these spectroscopic analyses.