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Updated: May 21, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
07:38

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

Published on: April 18, 2019

Mapping of minority carrier lifetime distributions in multicrystalline silicon using transient electron-beam-induced

Takuya Kushida1, Shigeyasu Tanaka, Chiaki Morita

  • 1Department of Electronics, EcoTopia Science Institute, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, Japan.

Journal of Electron Microscopy
|June 22, 2012
PubMed

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