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Correcting scanning instabilities from images of periodic structures
Nadi Braidy1, Yann Le Bouar, Sorin Lazar
1Département de génie chimique et de génie biotechnologique, Université de Sherbrooke. 2500 Boul. de l'Université, Sherbrooke, Québec, Canada J1H 2R1. nadi.braidy@usherbrooke.ca
Ultramicroscopy
|June 26, 2012
Summary
This study introduces a new method to fix row displacement errors in scanning transmission electron microscopy (STEM) images. The technique uses Fourier space phase analysis to correct distortions, improving image clarity for materials science applications.
Area of Science:
- Materials Science
- Electron Microscopy
- Image Analysis
Background:
- Lattice images from scanning-based techniques like STEM can suffer from row displacement errors.
- These distortions manifest as vertical streaks in Fourier space, degrading image quality.
Purpose of the Study:
- To present a novel method for measuring and correcting row displacement errors in scanning-based lattice images.
- To improve the accuracy and clarity of images obtained from techniques like STEM.
Main Methods:
- Developed a method based on phase analysis of streaks in Fourier space.
- Applied the algorithm to a model image and experimental STEM images of Si <110> and CoPt nanocrystals.
Main Results:
- Successfully measured and corrected row displacement errors.
- Demonstrated the validity and precision of the method on various sample images.
- The correction algorithm is available as a Digital Micrograph™ script.
Conclusions:
- The proposed method effectively corrects row displacement distortions in STEM images.
- Phase analysis in Fourier space provides a precise way to address these imaging artifacts.
- The freely available script facilitates the application of this correction technique in research.
