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Fabrication And Characterization Of Photonic Crystal Slow Light Waveguides And Cavities
Published on: November 30, 2012
Permeability retrieval in InP-based waveguide optical device combined with metamaterial
Tomohiro Amemiya1, Seiji Myoga, Takahiko Shindo
1Quantum Nanoelectronics Research Center, Tokyo Institute of Technology, Tokyo 152-8552, Japan. amemiya.t.ab@m.titech.ac.jp
Optics Letters
|June 29, 2012
Summary
Researchers developed a new method using a Mach-Zehnder interferometer to measure metamaterial properties. This technique accurately determines complex permeability for designing advanced photonic integrated circuits.
Area of Science:
- Photonics
- Materials Science
- Electromagnetism
Background:
- Metamaterials offer unique electromagnetic properties not found in natural materials.
- Accurate characterization of metamaterial constitutive parameters is crucial for device design.
- Waveguide-based photonic devices require precise control over light-matter interactions.
Purpose of the Study:
- To develop and demonstrate a novel measurement technique for determining the complex permeability of metamaterials.
- To validate the technique using an Indium Phosphide (InP)-based Mach-Zehnder interferometer and a split-ring resonator metamaterial.
- To enable the design of advanced photonic integrated circuits utilizing metamaterial functionalities.
Main Methods:
- Fabrication of an InP-based Mach-Zehnder interferometer integrated with a split-ring resonator metamaterial layer.
- Optical characterization of the device at a wavelength of 1.5 μm.
- Analysis of the interference patterns to extract the complex permeability of the metamaterial.
Main Results:
- The constructed device successfully measured the complex permeability of the metamaterial.
- A non-unity relative permeability was observed at 1.5 μm, attributed to magnetic interaction with light.
- The measurement method proved effective for characterizing waveguide-based photonic devices.
Conclusions:
- The developed interferometric method is a viable tool for determining metamaterial constitutive parameters.
- This technique facilitates the integration of metamaterials into photonic integrated circuits.
- Accurate characterization is key to unlocking the full potential of metamaterials in optical applications.

