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Infrared optical constants n, κ, and absorption of topological insulator BiSb thin films determined by the
Abstract:
In this work, we measure the infrared optical constants (n, κ) of topological insulator BiSb thin films using the reflectance-transmittance method. Using the obtained (n, κ), we reveal that Bi, Bi0.9Sb0.1, and Bi0.85Sb0.15 show absorption of about 30% for film thicknesses around 20 nm and a large refractive index ranging from 6 to 9 in the infrared region. Our results suggest that BiSb has strong potential as a material for MIR detectors.
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