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Updated: May 21, 2026
08:04
Preparation and Observation of Thick Biological Samples by Scanning Transmission Electron Tomography
Published on: March 12, 2017
Scanning transmission electron microscopy: Albert Crewe's vision and beyond.
Ondrej L Krivanek1, Matthew F Chisholm, Matthew F Murfitt
1Nion Company, 1102 8th Street, Kirkland, WA 98033, USA. krivanek@nion.com
Ultramicroscopy
|June 30, 2012
Summary
Scanning transmission electron microscopy (STEM) now achieves 0.5Å resolution and single-atom identification, fulfilling early visions. Current STEM research focuses on rapid imaging and analyzing atomic properties.
Area of Science:
- Materials Science
- Physics
- Chemistry
Background:
- The development of the scanning transmission electron microscope (STEM) began in the 1960s and 1970s with ambitious goals.
- Early visions for STEM included achieving sub-angstrom resolution and spectroscopically identifying single atoms.
Purpose of the Study:
- To review the historical achievements in STEM technology.
- To discuss the current state of STEM, including attained resolutions and capabilities.
- To explore emerging directions and future challenges in atomic resolution microscopy.
Main Methods:
- Review of historical data and technological advancements in STEM.
- Analysis of current STEM capabilities in atomic resolution imaging and spectroscopy.
- Illustration of practical applications and future research avenues.
Main Results:
- STEM technology has now achieved the 0.5Å resolution goal set decades ago.
- Single atoms can now be identified spectroscopically using STEM.
- New research directions include rapid atomic imaging and probing atomic bonding and electronic properties.
Conclusions:
- STEM has reached a significant milestone, fulfilling its initial ambitious goals.
- Future STEM development will focus on advanced imaging techniques and exploring fundamental material properties at the atomic level.
- Continued innovation in STEM promises deeper insights into materials science and nanotechnology.
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