Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

Confocal Fluorescence Microscopy

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Shear Stress Targeted Delivery of Nitroglycerin to Brain Collaterals Improves Ischaemic Stroke Outcome.

Advanced science (Weinheim, Baden-Wurttemberg, Germany)·2025

Same author

Modulated-Illumination Intermittent-Contact Tip-Enhanced Raman Spectroscopy.

Nano letters·2025

Same author

Constant di/dz scanning tunneling microscopy: Atomic precision imaging and hydrogen depassivation lithography on a Si(100)-2 × 1:H surface.

The Review of scientific instruments·2025

Same author

Atom-resolved imaging with a silicon tip integrated into an on-chip scanning tunneling microscope.

The Review of scientific instruments·2024

Same author

Biomechanics Characterization of Autonomic and Somatic Nerves by High Dynamic Closed-Loop MEMS force sensing.

bioRxiv : the preprint server for biology·2023

Same author

High resolution atomic force microscopy with an active piezoelectric microcantilever.

The Review of scientific instruments·2022

Search research articles

Related Experiment Video

Updated: May 20, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues.

A Bazaei¹, Yuen K Yong, S O Reza Moheimani

¹School of Electrical Engineering and Computer Science, The University of Newcastle, Callaghan, NSW 2308, Australia. ali.bazaei@newcastle.edu.au

The Review of Scientific Instruments

|July 5, 2012

Summary

This study introduces Lissajous patterns for faster scanning in microscopy, overcoming limitations of traditional sawtooth waveforms. The new method significantly improves tracking performance and image resolution for high-speed scanning applications.

More Related Videos

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Published on: June 30, 2023

Related Experiment Videos

Last Updated: May 20, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection

Published on: June 13, 2023

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

Published on: March 22, 2024

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Published on: June 30, 2023

Area of Science:

Scanning Probe Microscopy
Nanotechnology
Control Systems Engineering

Background:

High-speed scanning in applications like scanning probe microscopy is limited by non-smooth waveforms (e.g., sawtooth) that excite mechanical resonances.
These resonances restrict scan range and bandwidth, leading to image distortion during fast raster scanning.

Purpose of the Study:

To propose and analyze a nonlinear, smooth closed curve (Lissajous pattern) for significantly faster scanning operations compared to conventional patterns.
To develop systematic methodologies for determining scan parameters based on a closed-form measure of image resolution for Lissajous patterns.

Main Methods:

Implementation of the Lissajous pattern non-raster scan method on an atomic force microscope using internal model controllers (IMC).
Inclusion of higher-order harmonic oscillators within IMC controllers to mitigate tracking errors caused by actuator nonlinearities.
Comparison of the proposed IMC controller with traditional IMC and integral controllers for tracking performance and noise rejection.

Main Results:

The Lissajous pattern enables much faster scanning operations than ordinary scan patterns.
A closed-form measure for image resolution facilitates systematic determination of scan parameters.
The enhanced IMC controller demonstrates significant improvement in tracking performance over traditional IMC methods.
The proposed IMC controller exhibits superior tracking performance compared to integral controllers, especially concerning noise rejection.

Conclusions:

Lissajous patterns offer a viable solution for achieving high-speed scanning in microscopy, overcoming the limitations of traditional waveforms.
The developed IMC strategy with harmonic oscillators effectively reduces tracking errors and enhances performance in nonlinear systems.
This approach provides a robust and efficient method for improving scan speed and image quality in scanning probe microscopy.