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Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high

Tom Wirtz1, Yves Fleming, Mathieu Gerard

  • 1Department Science and Analysis of Materials (SAM), Centre de Recherche Public, Gabriel Lippmann, 41 rue du Brill, L-4422 Belvaux, Luxembourg. wirtz@lippmann.lu

The Review of Scientific Instruments
|July 5, 2012
PubMed

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