Deflection gating for time-resolved x-ray magnetic circular dichroism-photoemission electron microscopy using

C Wiemann1, A M Kaiser, S Cramm

  • 1Peter Grünberg Institut PGI-6 Electronic Properties, Research Centre Jülich, D-52425 Jülich, Germany.

Summary

A new gating technique for time-resolving photoemission microscopy enables picosecond measurements. This method uses electrostatic deflection for fast switching, significantly improving dark current rejection and data acquisition.

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