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Updated: May 20, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Determination of work function of graphene under a metal electrode and its role in contact resistance

Seung Min Song1, Jong Kyung Park, One Jae Sul

  • 1Department of Electrical Engineering, KAIST, 291 Daehak-ro, Yuseong-gu, Daejeon, Korea, 305-701.

Nano Letters
|July 11, 2012
PubMed

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