[Application of atomic force microscopy (AFM) in ophthalmology]

Michał Milka1, Iwona Mróz, Maria Jastrzebska

  • 1Oddział Okulistyczny Okregowego Szpitala Kolejowego w Katowicach. milkamichal@gmail.com

Klinika Oczna
|July 13, 2012
PubMed
Summary

Atomic force microscopy (AFM) reveals nanoscale surface changes on explanted intraocular lenses (IOLs). This advanced imaging technique aids in understanding the early stages of IOL opacity formation, crucial for ophthalmology research.