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Related Concept Videos

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There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
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Dual-modulator broadband infrared Mueller matrix ellipsometry.

Liam J K Cross1, Dennis K Hore

  • 1Department of Chemistry, University of Victoria, Victoria, British Columbia, Canada.

Applied Optics
|August 4, 2012
PubMed
Summary

A new broadband mid-infrared Mueller matrix ellipsometer uses photoelastic modulators and a step-scan interferometer. This instrument enables spectroscopic analysis of material properties in various geometries.

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Area of Science:

  • Optics and Photonics
  • Spectroscopy
  • Materials Science

Background:

  • Mueller matrix ellipsometry is a powerful technique for characterizing optical properties of materials.
  • Broadband mid-infrared spectroscopy offers insights into molecular vibrations and chemical composition.
  • Developing advanced ellipsometers is crucial for detailed material analysis.

Purpose of the Study:

  • To describe a novel broadband mid-infrared Mueller matrix ellipsometer.
  • To demonstrate its spectroscopic capabilities in both transmission and reflection modes.
  • To validate the instrument's performance through measurements of known samples.

Main Methods:

  • Utilized two photoelastic modulators and a step-scan interferometer for broadband operation.
  • Employed a combined hardware-software double Fourier transformation for data analysis.
  • Incorporated infrared wavelength-dependent retardation amplitude calibration for accurate spectral data.

Main Results:

  • Successfully measured Mueller matrices of air, quartz crystal, and ZnSe-water interface.
  • Demonstrated spectroscopic capability across the 2500-4000 cm(-1) spectral range.
  • Validated the instrument's performance in both transmission and reflection geometries.

Conclusions:

  • The developed instrument provides broadband mid-infrared Mueller matrix spectroscopic capabilities.
  • The calibration and data processing methods ensure accurate spectral characterization.
  • This ellipsometer is suitable for analyzing diverse samples and interfaces in the mid-infrared region.