Utility of the Stanford-Binet IV Abbreviated Form for placing exceptional children

Stanford-Binet IV General Purpose Abbreviated Battery Scores were extracted from full battery administrations given to 19 developmentally handicapped children in a naturally occurring sample. The Pearson correlation with complete test Composite Scores was .94 (p less than .001). Short-form scores were higher in 47%, lower in 21%, and the same in 32% of the cases.